• DocumentCode
    3082592
  • Title

    Comparing fast convolution and model order reduction methods for S-parameter simulation

  • Author

    Schutt-Aine, J.E. ; Goh, P.

  • Author_Institution
    Electr. & Comput. Eng., Univ. of Illinois, Urbana, IL, USA
  • fYear
    2013
  • fDate
    12-15 Dec. 2013
  • Firstpage
    134
  • Lastpage
    137
  • Abstract
    This paper presents a comparison of the model-order reduction and fast convolution techniques for the macromodel simulation. Model-order reduction techniques using the vector fitting method have been extensively employed. In parallel, convolution techniques using scattering parameters have demonstrated special properties that can be exploited by acceleration techniques to achieve superior performance. The comparison is performed using simulations for various blackbox data.
  • Keywords
    S-parameters; circuit simulation; convolution; multiport networks; network analysis; S-parameter simulation; acceleration techniques; blackbox data; fast convolution technique; macromodel simulation; model order reduction methods; multiport networks; scattering parameters; vector fitting method; Approximation methods; Computational modeling; Convolution; Fitting; Frequency-domain analysis; Scattering parameters; Vectors; Blackbox; Causality; Convolution; Macromodel; Passivity; Scattering Parameters; Vector Fitting;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Design of Advanced Packaging and Systems Symposium (EDAPS), 2013 IEEE
  • Conference_Location
    Nara
  • Print_ISBN
    978-1-4799-2313-7
  • Type

    conf

  • DOI
    10.1109/EDAPS.2013.6724407
  • Filename
    6724407