Title :
Comparing fast convolution and model order reduction methods for S-parameter simulation
Author :
Schutt-Aine, J.E. ; Goh, P.
Author_Institution :
Electr. & Comput. Eng., Univ. of Illinois, Urbana, IL, USA
Abstract :
This paper presents a comparison of the model-order reduction and fast convolution techniques for the macromodel simulation. Model-order reduction techniques using the vector fitting method have been extensively employed. In parallel, convolution techniques using scattering parameters have demonstrated special properties that can be exploited by acceleration techniques to achieve superior performance. The comparison is performed using simulations for various blackbox data.
Keywords :
S-parameters; circuit simulation; convolution; multiport networks; network analysis; S-parameter simulation; acceleration techniques; blackbox data; fast convolution technique; macromodel simulation; model order reduction methods; multiport networks; scattering parameters; vector fitting method; Approximation methods; Computational modeling; Convolution; Fitting; Frequency-domain analysis; Scattering parameters; Vectors; Blackbox; Causality; Convolution; Macromodel; Passivity; Scattering Parameters; Vector Fitting;
Conference_Titel :
Electrical Design of Advanced Packaging and Systems Symposium (EDAPS), 2013 IEEE
Conference_Location :
Nara
Print_ISBN :
978-1-4799-2313-7
DOI :
10.1109/EDAPS.2013.6724407