DocumentCode
3082615
Title
When to stop verification?: Statistical trade-off between expected loss and simulation cost
Author
Jha, Sumit Kumar ; Langmead, Christopher James ; Mohalik, Swarup ; Ramesh, Sethu
Author_Institution
Comput. Sci. Dept., Univ. of Central Florida, Orlando, FL, USA
fYear
2011
fDate
14-18 March 2011
Firstpage
1
Lastpage
6
Abstract
Exhaustive state space exploration based verification of embedded system designs remains a challenge despite three decades of active research into Model Checking. On the other hand, simulation based verification of even critical embedded system designs is often subject to financial budget considerations in practice. In this paper, we suggest an algorithm that minimizes the overall cost of producing an embedded system including the cost of testing the embedded system and expected losses from an incompletely tested design. We seek to quantify the trade-off between the budget for testing and the potential financial loss from an incorrect design. We demonstrate that our algorithm needs only a logarithmic number of test samples in the cost of the potential loss from an incorrect validation result. We also show that our approach remains sound when only upper bounds on the potential loss and lower bounds on the cost of simulation are available. We present experimental evidence to corroborate our theoretical results.
Keywords
embedded systems; formal verification; embedded system designs; model checking; simulation based verification; state space exploration based verification; Adaptation model; Bayesian methods; Biological system modeling; Computational modeling; Embedded systems; Probabilistic logic; Stochastic processes;
fLanguage
English
Publisher
ieee
Conference_Titel
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2011
Conference_Location
Grenoble
ISSN
1530-1591
Print_ISBN
978-1-61284-208-0
Type
conf
DOI
10.1109/DATE.2011.5763210
Filename
5763210
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