Title :
When to stop verification?: Statistical trade-off between expected loss and simulation cost
Author :
Jha, Sumit Kumar ; Langmead, Christopher James ; Mohalik, Swarup ; Ramesh, Sethu
Author_Institution :
Comput. Sci. Dept., Univ. of Central Florida, Orlando, FL, USA
Abstract :
Exhaustive state space exploration based verification of embedded system designs remains a challenge despite three decades of active research into Model Checking. On the other hand, simulation based verification of even critical embedded system designs is often subject to financial budget considerations in practice. In this paper, we suggest an algorithm that minimizes the overall cost of producing an embedded system including the cost of testing the embedded system and expected losses from an incompletely tested design. We seek to quantify the trade-off between the budget for testing and the potential financial loss from an incorrect design. We demonstrate that our algorithm needs only a logarithmic number of test samples in the cost of the potential loss from an incorrect validation result. We also show that our approach remains sound when only upper bounds on the potential loss and lower bounds on the cost of simulation are available. We present experimental evidence to corroborate our theoretical results.
Keywords :
embedded systems; formal verification; embedded system designs; model checking; simulation based verification; state space exploration based verification; Adaptation model; Bayesian methods; Biological system modeling; Computational modeling; Embedded systems; Probabilistic logic; Stochastic processes;
Conference_Titel :
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2011
Conference_Location :
Grenoble
Print_ISBN :
978-1-61284-208-0
DOI :
10.1109/DATE.2011.5763210