Title :
Average error rate of linear diversity reception schemes over generalized gamma fading channels
Author :
Piboongungon, Terawat ; Aalo, Valentine A. ; Iskander, Cyril-Daniel
Author_Institution :
Dept. of Electr. Eng., Florida Atlantic Univ., Boca Raton, FL, USA
Abstract :
We study the performance of M-ary modulation schemes in the presence of additive white Gaussian noise (AWGN) and slow fading. Selection combining (SC), equal gain combining (EGC), and maximal ratio combining (MRC) diversity schemes are considered. The fading channel is modeled by the generalized gamma distribution, which includes the Rayleigh, Nakagami, Weibull, and log-normal distributions as special or limiting cases. The Suzuki distribution can be adequately approximated by the generalized gamma distribution. The exact average symbol error rates (ASER) for coherent multilevel modulation schemes with SC and MRC are presented by using the moment generating function (MGF) based approach while that of EGC is obtained by employing a characteristic function (CHF) based approach. The analysis results for the three combiners are compared and discussed. Simulation results are also provided.
Keywords :
AWGN channels; Rayleigh channels; Weibull distribution; diversity reception; error statistics; gamma distribution; log normal distribution; modulation; AWGN; M-ary modulation; MRC; Nakagami distribution; Rayleigh distribution; Suzuki distribution; Weibull distribution; additive white Gaussian noise; average error rate; average symbol error rate; characteristic function; coherent multilevel modulation schemes; equal gain combining; generalized gamma fading channels; linear diversity reception schemes; log-normal distribution; maximal ratio combining; moment generating function; selection combining; slow fading; AWGN; Diversity reception; Error analysis; Log-normal distribution; Nakagami distribution; Rayleigh channels; Shadow mapping; Statistical distributions; System performance; Weibull fading channels;
Conference_Titel :
SoutheastCon, 2005. Proceedings. IEEE
Print_ISBN :
0-7803-8865-8
DOI :
10.1109/SECON.2005.1423257