Title :
13th IEEE International On-Line Testing Symposium-Title
Abstract :
The following topics are dealt with: reliability issue in nanometer technology; network-on-chip reliability and fault tolerance; secure systems; large scale dependability; SoC and asynchronous circuits; radiation effects; signal integrity and error compensation; on-line testing; parallel multi-core chips; processor-based testing; self-checking and self-testing.
Keywords :
asynchronous circuits; automatic testing; fault tolerance; nanotechnology; network-on-chip; radiation effects; SoC; asynchronous circuit; fault tolerance; multicore chip; nanometer technology; network-on-chip reliability; on-line testing; processor-based testing; radiation effect; secure system; self-testing; signal integrity;
Conference_Titel :
On-Line Testing Symposium, 2007. IOLTS 07. 13th IEEE International
Conference_Location :
Crete
Print_ISBN :
0-7695-2918-6
DOI :
10.1109/IOLTS.2007.3
