Title :
A better ATPG algorithm and its design principles
Author :
Wang, Li.-C. ; Williams, Thomas W. ; Mercer, M. Ray
Author_Institution :
Texas Univ., Austin, TX, USA
Abstract :
The traditional goal of an ATPG algorithm is to achieve a high fault coverage by producing a small number of tests. However, since usually a high fault coverage does not imply a high defect coverage, such an objective can mislead us to overtrust an ATPG method which is optimal for faults but inefficient for defects. The paper presents several new principles to design an ATPG algorithm for solve this problem. The new principles direct an ATPG algorithm to improve its efficiency and reliability for detecting the non target defects through the target faults. Theory and experiments are presented to demonstrate the superiority of the new principles and the new test generation algorithm
Keywords :
CAD; automatic test software; design engineering; fault diagnosis; manufacturing data processing; ATPG algorithm; automatic test pattern generation; defect coverage; defective part identification; design principles; fault coverage; fault simulation; non target defects; test generation algorithm; Algorithm design and analysis; Automatic test pattern generation; Automatic testing; Circuit faults; Circuit testing; Electrical fault detection; Fault detection; Manufacturing; Performance evaluation; Semiconductor device testing;
Conference_Titel :
Computer Design: VLSI in Computers and Processors, 1996. ICCD '96. Proceedings., 1996 IEEE International Conference on
Conference_Location :
Austin, TX
Print_ISBN :
0-8186-7554-3
DOI :
10.1109/ICCD.1996.563564
