Title :
Design for Resilience to Soft Errors and Variations
Author :
Zhang, Ming ; Mak, TM ; Tschanz, Jim ; Kim, Kee Sup ; Seifert, Norbert ; Lu, Davia
Abstract :
This paper presents adaptive variation-and-error-resilient agent (AVERA), an approach to address the challenge of designing reliable systems in the presence of soft errors and variations. AVERA extends our previous built-in soft error resilience (BISER) approach by adding additional capabilities to support process variation diagnosis, degradation detection, and system adaptation, besides soft error correction. We also discuss open challenges for building variation-and-error-resilient systems.
Keywords :
CMOS integrated circuits; error correction; integrated circuit design; CMOS technology; adaptive variation-and-error- resilient agent; built-in soft error resilience approach; degradation detection; process variation diagnosis; soft error correction; system adaptation; Circuits; Degradation; Error correction; Flip-flops; Human computer interaction; Niobium compounds; Resilience; Threshold voltage; Titanium compounds; Transistors;
Conference_Titel :
On-Line Testing Symposium, 2007. IOLTS 07. 13th IEEE International
Conference_Location :
Crete
Print_ISBN :
0-7695-2918-6
DOI :
10.1109/IOLTS.2007.26
