DocumentCode :
3083298
Title :
Electrical capability assessment for high wiring density organic interposer
Author :
Okamoto, K. ; Mori, Hisamichi ; Orii, Y.
Author_Institution :
Electron. & Opt. Packaging, IBM Res. - Tokyo, Kawasaki, Japan
fYear :
2013
fDate :
12-15 Dec. 2013
Firstpage :
265
Lastpage :
269
Abstract :
Silicon and glass interposers provide a solution to keep scaling of C4 dimensions and chip-to-chip interconnect density by supporting high bandwidth. However there are still some challenges in the fabrication process and cost. As another alternative solution, organic material would be a candidate. In order to perform the feasibility study for allowable bandwidth with organic material, various electrical parametric analyses were performed assuming simple chip-to-chip bus connection in the region of less than 10 μm trace width. The results are indicating that the bandwidth with assumed organic material is comparable or more to one with SiO2 material and the trace width to obtain the bandwidth peak is 1-2 μm.
Keywords :
elemental semiconductors; glass; integrated circuit interconnections; organic semiconductors; silicon; wiring; C4 dimensions; chip-to-chip bus connection; chip-to-chip interconnect density; electrical capability assessment; electrical parametric analysis; fabrication process; glass interposers; high wiring density organic interposer; organic material; silicon interposers; Bandwidth; Conductors; Dielectric materials; Impedance; Organic materials; Silicon; Electrical interconnect; organic interposer; signal integrity; trasmission line;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Design of Advanced Packaging and Systems Symposium (EDAPS), 2013 IEEE
Conference_Location :
Nara
Print_ISBN :
978-1-4799-2313-7
Type :
conf
DOI :
10.1109/EDAPS.2013.6724440
Filename :
6724440
Link To Document :
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