Title :
Mathematics of 2r-port S-parameter Estimation by the r-port measurements
Author :
Maeda, Noboru ; Fukui, Satoshi ; Naoi, Takashi ; Ichikawa, Kazuhisa ; Sekine, Taku ; Takahashi, Y.
Author_Institution :
Nippon Soken, Inc., Nishio, Japan
Abstract :
An estimation method of the 2r-port S-parameters for reciprocal circuits is presented. In this method, several known loads are connected to r ports in turn and reflection and transmission characteristics among the remaining r ports are measured. Therefore, there is no need to connect a network analyzer to the ports that are connected to the known loads. S-parameters are obtained by solving several linear equations and quadratic equations only. In addition, applying this method to estimate the S-parameters of an circuit model of an enclosure mounting an IC chip, validness of this method is confirmed.
Keywords :
S-parameters; integrated circuit modelling; mathematics; measurement systems; 2r-port S-parameter estimation; IC chip; circuit model; linear equations; mathematics; quadratic equations; r-port measurements; reciprocal circuits; reflection characteristics; transmission characteristics; turn characteristics; Estimation; Gold; Integrated circuits; Ports (Computers); Scattering parameters; Semiconductor device measurement; Sensors; IC chip; S-parameter; automotive components; immunity test; multiple port circuit;
Conference_Titel :
Electrical Design of Advanced Packaging and Systems Symposium (EDAPS), 2013 IEEE
Conference_Location :
Nara
Print_ISBN :
978-1-4799-2313-7
DOI :
10.1109/EDAPS.2013.6724441
