Title :
A statistical approach to quantifying the EIRP Spectral Density for SOTM terminals
Author :
Ouyang, Feng ; Weerackody, Vijitha
Author_Institution :
Appl. Phys. Lab., Johns Hopkins Univ., Laurel, MD, USA
Abstract :
This paper proposes a statistical approach to off-axis EIRP masks, in order to accommodate satellite communications on the move (SOTM) terminals. A ¿statistical mask¿ provides a reference EIRP Spectral Density (ESD) limitation, which can be exceeded with a specified maximum probability. Statistical masks and their implementation approaches are discussed in detail. Simulations are provided to show that the resulting interference is quantifiable and bounded. The statistical mask provides a sound and practical means in controlling interference. This work provides input to the on-going effort of setting emission standards for SOTM by ITU and military standard bodies.
Keywords :
mobile satellite communication; radiofrequency interference; statistical analysis; telecommunication standards; EIRP spectral density; ITU; SOTM terminals; emission standards; military standard; satellite communications on the move terminal; statistical approach; statistical mask; Electrostatic discharge; Electrostatic interference; Frequency; Laboratories; Military satellites; Military standards; Physics; Probability; Satellite communication; Satellite ground stations;
Conference_Titel :
Military Communications Conference, 2009. MILCOM 2009. IEEE
Conference_Location :
Boston, MA
Print_ISBN :
978-1-4244-5238-5
Electronic_ISBN :
978-1-4244-5239-2
DOI :
10.1109/MILCOM.2009.5379853