Title :
A Rapid Fault Injection Approach for Measuring SEU Sensitivity in Complex Processors
Author :
Portela-Garcìa, Marta ; López-Ongil, Celia ; Garcìa-Valderas, Mario ; Entrena, Luis
Author_Institution :
Carlos III Univ. of Madrid, Madrid
Abstract :
Processors are very common components in current digital systems and to assess their reliability is an essential task during the design process. In this paper a new fault injection solution to measure SEU sensitivity in processors is presented. It consists in a hardware-implemented module that performs fault injection through the available JTAG-based On-Chip Debugger (OCD). It can be widely applicable to different processors since JTAG standard is an extended interface and OCDs are usually available in current processors. The hardware implementation avoids the communication between the target system and the software debugging tool. The method has been applied to a complex processor, the ARM7TDMI. Results illustrate the approach is a fast, efficient and cost-effective solution.
Keywords :
automatic testing; fault diagnosis; microprocessor chips; radiation hardening (electronics); ARM7TDMI processor; JTAG-based on-chip debugger; SEU sensitivity; complex processors; rapid fault injection approach; reliability assessment; Circuit faults; Circuit simulation; Circuit testing; Debugging; Fault tolerance; Performance evaluation; Prototypes; Registers; Single event upset; Software prototyping;
Conference_Titel :
On-Line Testing Symposium, 2007. IOLTS 07. 13th IEEE International
Conference_Location :
Crete
Print_ISBN :
0-7695-2918-6
DOI :
10.1109/IOLTS.2007.9