• DocumentCode
    3083457
  • Title

    Temporal parallel simulation: A fast gate-level HDL simulation using higher level models

  • Author

    Kim, Dusung ; Ciesielski, Maciej ; Shim, Kyuho ; Yang, Seiyang

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of Massachusetts, Amherst, MA, USA
  • fYear
    2011
  • fDate
    14-18 March 2011
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    Simulation speedup offered by distributed parallel event-driven simulation is known to be seriously limited by the synchronization and communication overhead. These limiting factors are particularly severe in gate-level timing simulation. This paper describes a radically different approach to gate-level simulation based on a concept of temporal rather than conventional spatial parallelism. The proposed method partitions the entire simulation run into simulation slices in temporal domain and each slice is simulated separately. With each slice being independent from each other, an almost linear speedup is achievable with a large number of simulation nodes. This concept naturally enables “correct by simulation” methodology that explicitly maintains the consistency between the reference and the target specifications. Experimental results clearly show a significant simulation speed-up.
  • Keywords
    hardware description languages; parallel processing; simulation languages; conventional spatial parallelism; correct by simulation methodology; distributed parallel event driven simulation; fast gate level HDL simulation; gate level timing simulation; higher level model; simulation speedup; temporal parallel simulation; Clocks; Delay; Hardware design languages; Logic gates; Mathematical model; Synchronization; Event-driven simulation; Gate-level simulation; parallel simulation; verilog simulation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation & Test in Europe Conference & Exhibition (DATE), 2011
  • Conference_Location
    Grenoble
  • ISSN
    1530-1591
  • Print_ISBN
    978-1-61284-208-0
  • Type

    conf

  • DOI
    10.1109/DATE.2011.5763251
  • Filename
    5763251