Title :
Heavy Ion Test Results in a CMOS triple Voting Register for a High-Energy Physics Experiment
Author :
Cano, X. ; Bota, S. ; Graciani, R. ; Gascón, D. ; Herms, A. ; Comerma, A. ; Segura, J. ; Garrido, L.
Author_Institution :
Univ. Barcelona, Barcelona
Abstract :
A heavy ion radiation test has been performed to evaluate the SEU sensitivity on a mixed-mode ASIC. We present the results obtained when the Triple Voting Registers used in the digital block of the ASIC are irradiated with heavy ions.
Keywords :
CMOS integrated circuits; application specific integrated circuits; ion beams; CMOS triple voting register; SEU sensitivity; heavy ion radiation test; high-energy physics experiment; mixed-mode ASIC; Application specific integrated circuits; Master-slave; Photomultipliers; Physics; Protection; Registers; Single event upset; TV; Testing; Voting;
Conference_Titel :
On-Line Testing Symposium, 2007. IOLTS 07. 13th IEEE International
Conference_Location :
Crete
Print_ISBN :
0-7695-2918-6
DOI :
10.1109/IOLTS.2007.36
