• DocumentCode
    3083740
  • Title

    Heavy Ion Test Results in a CMOS triple Voting Register for a High-Energy Physics Experiment

  • Author

    Cano, X. ; Bota, S. ; Graciani, R. ; Gascón, D. ; Herms, A. ; Comerma, A. ; Segura, J. ; Garrido, L.

  • Author_Institution
    Univ. Barcelona, Barcelona
  • fYear
    2007
  • fDate
    8-11 July 2007
  • Firstpage
    183
  • Lastpage
    184
  • Abstract
    A heavy ion radiation test has been performed to evaluate the SEU sensitivity on a mixed-mode ASIC. We present the results obtained when the Triple Voting Registers used in the digital block of the ASIC are irradiated with heavy ions.
  • Keywords
    CMOS integrated circuits; application specific integrated circuits; ion beams; CMOS triple voting register; SEU sensitivity; heavy ion radiation test; high-energy physics experiment; mixed-mode ASIC; Application specific integrated circuits; Master-slave; Photomultipliers; Physics; Protection; Registers; Single event upset; TV; Testing; Voting;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    On-Line Testing Symposium, 2007. IOLTS 07. 13th IEEE International
  • Conference_Location
    Crete
  • Print_ISBN
    0-7695-2918-6
  • Type

    conf

  • DOI
    10.1109/IOLTS.2007.36
  • Filename
    4274841
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3083740