DocumentCode
3083768
Title
VLSI design and test sequence in an academic environment: a case study
Author
Nowakowski, Pawel ; Dziurla-Rucinska, Barbara ; Rucinski, Andrzej
Author_Institution
Dept. of Electr. & Comput. Eng., New Hampshire Univ., Durham, NH, USA
fYear
1999
fDate
1999
Firstpage
22
Lastpage
23
Abstract
Testing is an integral part of IC development process and its importance is steadily increasing. At the same time there exists a shortage of test engineers in the marketplace. The authors observe a considerable unbalance in the electrical engineering curricula between an abundance of courses offered in VLSI design/semiconductor materials and in testing. One of the root causes is due to the cost of the course related test equipment. This paper presents an educational experience implemented at the University of New Hampshire which incorporates both the design and testing aspects in VLSI which has been facilitated by the generous support and involvement of the regional industry. Additional byproducts of the course sequence are ambitious real life projects conducted by the students
Keywords
VLSI; educational courses; electronic engineering education; integrated circuit design; integrated circuit testing; IC development process; IC testing; USA; VLSI design; academic environment; case study; courses; electrical engineering curricula; students; test equipment; test sequence; university; Computer aided software engineering; Testing; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
Microelectronic Systems Education, 1999. MSE'99. IEEE International Conference on
Conference_Location
Arlington, VA
Print_ISBN
0-7695-0312-8
Type
conf
DOI
10.1109/MSE.1999.787018
Filename
787018
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