DocumentCode :
3083815
Title :
Realization and SEM observation of polysilicon and aluminium cantilever using surface micromachining technology
Author :
Lucas, S. ; Outaleb, N. ; Bonnaud, O. ; Pinel, J.
Author_Institution :
Groupe de Microelectron. et Visualisation, Rennes I Univ., France
fYear :
1999
fDate :
1999
Firstpage :
28
Lastpage :
29
Abstract :
This tutorial concerns graduate electronic engineering students, either in DESS, DEA or engineer formations. The aim of this training is to allow them to apply their knowledge of microelectronics lectures to surface micromachining technology. In this work, students fabricate a polysilicon and an aluminium cantilever beam by using the usual technological process steps in a cleanroom. The process is based on the stripping of an underlying sacrificial layer. At the end of the fabrication process, a scanning electron microscopy observation is performed
Keywords :
clean rooms; electronic engineering education; integrated circuits; micromachining; scanning electron microscopy; student experiments; surface treatment; training; Al; Si; aluminium; cantilever beam fabrication; cleanroom; fabrication process; graduate electronic engineering students; microelectronics lectures; polysilicon; sacrificial layer stripping; scanning electron microscopy observation; surface micromachining technology; technological process steps; Aluminum; Annealing; Chemical technology; Fabrication; Lithography; Micromachining; Silicon; Sputter etching; Sputtering; Structural beams;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microelectronic Systems Education, 1999. MSE'99. IEEE International Conference on
Conference_Location :
Arlington, VA
Print_ISBN :
0-7695-0312-8
Type :
conf
DOI :
10.1109/MSE.1999.787021
Filename :
787021
Link To Document :
بازگشت