Title :
>21% Efficient Silicon Heterojunction Solar Cells on n- and p-Type Wafers Compared
Author :
Descoeudres, Antoine ; Holman, Zachary C. ; Barraud, Loris ; Morel, Sophie ; De Wolf, Stefaan ; Ballif, Christophe
Author_Institution :
Photovoltaics & Thin-Film Electron. Lab., Ecole Polytech. Fed. de Lausanne (EPFL), Neuchatel, Switzerland
Abstract :
The properties and high-efficiency potential of front- and rear-emitter silicon heterojunction solar cells on n- and p-type wafers were experimentally investigated. In the low-carrier-injection range, cells on p-type wafers suffer from reduced minority carrier lifetime, mainly due to the asymmetry in interface defect capture cross sections. This leads to slightly lower fill factors than for n-type cells. By using high-quality passivation layers, however, these losses can be minimized. High open-circuit voltages (Vocs) were obtained on both types of float zone (FZ) wafers: up to 735 mV on n-type and 726 mV on p-type. The best Voc measured on Czochralski (CZ) p-type wafers was only 692 mV, whereas it reached 732 mV on CZ n-type. The highest aperture-area certified efficiencies obtained on 4 cm2 cells were 22.14% (Voc = 727 mV , FF = 78.4%) and 21.38% (Voc = 722 mV, FF = 77.1%) on n- and p-type FZ wafers, respectively, proving that heterojunction schemes can perform almost as well on high-quality p-type as on n-type wafers. To our knowledge, this is the highest efficiency ever reported for a full silicon heterojunction solar cell on a p-type wafer, and the highest Voc on any p-type crystalline silicon device with reasonable FF.
Keywords :
carrier lifetime; elemental semiconductors; minority carriers; p-n heterojunctions; passivation; silicon; solar cells; Czochralski p-type wafers; Si; aperture-area; fill factors; front-emitter silicon heterojunction solar cell; full silicon heterojunction solar cell; heterojunction schemes; high-efficiency potential; high-quality n-type wafer; high-quality p-type wafer; high-quality passivation layers; interface defect capture cross sections; low-carrier-injection; n-type cells; n-type float zone wafer; open-circuit voltages; p-type crystalline silicon device; p-type float zone wafer; rear-emitter silicon heterojunction solar cell; reduced minority carrier lifetime; voltage 692 mV; voltage 722 mV; voltage 726 mV; voltage 727 mV; voltage 732 mV; voltage 735 mV; Current measurement; Density measurement; Heterojunctions; Indium tin oxide; Photovoltaic cells; Silicon; Standards; Amorphous silicon; crystalline silicon; heterojunctions; photovoltaic cells;
Journal_Title :
Photovoltaics, IEEE Journal of
DOI :
10.1109/JPHOTOV.2012.2209407