• DocumentCode
    3084706
  • Title

    Defect type and its impact on the growth curve [software development]

  • Author

    Chillarege, Ram ; Kao, Wei-Lun ; Condit, Richard G.

  • Author_Institution
    IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA
  • fYear
    1991
  • fDate
    13-16 May 1991
  • Firstpage
    246
  • Lastpage
    255
  • Abstract
    The authors present an empirical investigation on possible cause and effect relationships between defects and the software development process. The authors use defect data from an operating systems development project and find that initialization defects are strongly related to the inflection noticed in the reliability growth. The defect type distribution identified process problems that concurred with the developer´s hindsight. Thus, it is shown that it is plausible that there exist other cause-effect relationships that could be identified. This finding could pave the way for a more systematic process control methodology to be applied to software development
  • Keywords
    software reliability; cause-effect relationships; defect type; growth curve; inflection; initialization defects; operating systems development project; reliability; software development; software development process; systematic process control methodology; Area measurement; Availability; Manufacturing processes; Marine vehicles; Operating systems; Process control; Programming; Software measurement; Testing; Turning;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Software Engineering, 1991. Proceedings., 13th International Conference on
  • Conference_Location
    Austin, TX
  • Print_ISBN
    0-8186-2140-0
  • Type

    conf

  • DOI
    10.1109/ICSE.1991.130649
  • Filename
    130649