DocumentCode
3084706
Title
Defect type and its impact on the growth curve [software development]
Author
Chillarege, Ram ; Kao, Wei-Lun ; Condit, Richard G.
Author_Institution
IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA
fYear
1991
fDate
13-16 May 1991
Firstpage
246
Lastpage
255
Abstract
The authors present an empirical investigation on possible cause and effect relationships between defects and the software development process. The authors use defect data from an operating systems development project and find that initialization defects are strongly related to the inflection noticed in the reliability growth. The defect type distribution identified process problems that concurred with the developer´s hindsight. Thus, it is shown that it is plausible that there exist other cause-effect relationships that could be identified. This finding could pave the way for a more systematic process control methodology to be applied to software development
Keywords
software reliability; cause-effect relationships; defect type; growth curve; inflection; initialization defects; operating systems development project; reliability; software development; software development process; systematic process control methodology; Area measurement; Availability; Manufacturing processes; Marine vehicles; Operating systems; Process control; Programming; Software measurement; Testing; Turning;
fLanguage
English
Publisher
ieee
Conference_Titel
Software Engineering, 1991. Proceedings., 13th International Conference on
Conference_Location
Austin, TX
Print_ISBN
0-8186-2140-0
Type
conf
DOI
10.1109/ICSE.1991.130649
Filename
130649
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