Title :
Power-noise measurements of small-scale inverter chains
Author :
Harada, Y. ; Yoshikawa, Kenichi ; Miura, Naruhisa ; Nagata, M. ; Murata, Atsuo ; Agatsuma, Shuji ; Ichikawa, Kazuhisa
Author_Institution :
Grad. Sch. of Syst. Inf., Kobe Univ., Kobe, Japan
Abstract :
This paper presents the measurements of power noise (Vdd noise) waveforms of a 5-stage inverter chain, using on-chip noise monitor circuits (OCM). The fine resolution of 0.4 mV in voltage and 12.5 ps in timing are realized. The undesired voltage variation by signal buffers in I/O cells is carefully eliminated by three means; (i) isolation of power domains, (ii) subtraction of background noise waveforms, and (iii) averaging iteratively captured waveforms.
Keywords :
circuit noise; invertors; noise measurement; waveform analysis; 5-stage inverter chain; I/O cells; OCM; background noise waveforms; iteratively captured waveforms; on-chip noise monitor circuits; power-noise measurements; signal buffers; small-scale inverter chains; Inverters; Noise; Noise measurement; Power measurement; Power supplies; Semiconductor device measurement; System-on-chip; On chip measurement; Power integrity; Power supply noise;
Conference_Titel :
Future of Electron Devices, Kansai (IMFEDK), 2013 IEEE International Meeting for
Conference_Location :
Suita
Print_ISBN :
978-1-4673-6106-4
DOI :
10.1109/IMFEDK.2013.6602259
