• DocumentCode
    3085050
  • Title

    Development of SiC power devices and modules for automotive motor drive use

  • Author

    Evans, Tanner ; Hanada, Toshiki ; Nakano, Yoshiaki ; Nakamura, T.

  • Author_Institution
    R&D Headquarters, Rohm Co., Ltd., Kyoto, Japan
  • fYear
    2013
  • fDate
    5-6 June 2013
  • Firstpage
    116
  • Lastpage
    117
  • Abstract
    SiC Power devices are expected to greatly improve the efficiencies and operating capabilities of next generation electric and hybrid electric vehicles. The use of these devices allows for drastic size and weight reduction at the module and system levels of motor drives used in automotive applications. A new SiC MOSFET structure with both gate and source trenches is presented. This greatly reduces device on-resistance while preventing oxide destruction at the gate trench bottoms. Finally new packaging methods under development are outlined that take advantage of the benefits these new devices have to offer by transfer molding them in a high temperature resistant epoxy resin. This leads to modules with low thermal resistance and high power density that, when configured as a three phase inverter, reduce total system footprint and parasitic inductance.
  • Keywords
    MOSFET; automotive electronics; electronics packaging; hybrid electric vehicles; motor drives; power semiconductor devices; resins; silicon compounds; thermal resistance; transfer moulding; wide band gap semiconductors; MOSFET structure; SiC; automotive motor drive use; device on resistance; gate trench bottoms; high power density; high temperature resistant epoxy resin; hybrid electric vehicles; low thermal resistance; next generation electric vehicles; parasitic inductance; power devices; three phase inverter; total system footprint; transfer molding; Logic gates; MOSFET; Multichip modules; Silicon carbide; Switches; Thermal resistance; MOSFET; Power Module; SiC; Transfer Mold;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Future of Electron Devices, Kansai (IMFEDK), 2013 IEEE International Meeting for
  • Conference_Location
    Suita
  • Print_ISBN
    978-1-4673-6106-4
  • Type

    conf

  • DOI
    10.1109/IMFEDK.2013.6602266
  • Filename
    6602266