DocumentCode :
3085327
Title :
Heterogeneous 3D integration — Technology enabler toward future super-chip
Author :
Koyanagi, Mitsumasa
Author_Institution :
New Ind. Creation Hatchery Center, Tohoku Univ., Sendai, Japan
fYear :
2013
fDate :
9-11 Dec. 2013
Abstract :
To overcome various concerns caused by scaling-down the device size, it is indispensable to introduce a new concept of heterogeneous 3D integration called a super-chip in which various kinds of device chips with different size, different devices and different materials are stacked. A key technology of self-assembly and electrostatic (SAE) temporary bonding has been developed to achieve a super-chip. Several kinds of super-chips are fabricated by stacking compound semiconductor device chip, photonic device chip and spintronic device chip on CMOS device chips.
Keywords :
CMOS integrated circuits; design for testability; integrated circuit bonding; magnetoelectronics; microprocessor chips; self-assembly; three-dimensional integrated circuits; CMOS device chips; compound semiconductor device chip; electrostatic temporary bonding; heterogeneous 3D integration; photonic device chip; self-assembly; spintronic device chip; superchip; technology enabler; CMOS integrated circuits; Large scale integration; Metals; Random access memory; Retina; Silicon; Three-dimensional displays;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting (IEDM), 2013 IEEE International
Conference_Location :
Washington, DC
Type :
conf
DOI :
10.1109/IEDM.2013.6724539
Filename :
6724539
Link To Document :
بازگشت