• DocumentCode
    3085377
  • Title

    InGaAs MOSFETs for CMOS: Recent advances in process technology

  • Author

    del Alamo, Jesus A. ; Antoniadis, D. ; Guo, Anjin ; Kim, Do-Hyeon ; Kim, Tae-Woo ; Lin, James ; Lu, Wenchao ; Vardi, Alon ; Zhao, Xingang

  • Author_Institution
    Microsyst. Technol. Labs., MIT, Cambridge, MA, USA
  • fYear
    2013
  • fDate
    9-11 Dec. 2013
  • Abstract
    InGaAs has recently emerged as the most attractive non-Si n-channel material for future nano-scale CMOS. InGaAs n-channel MOSFETs promise to advance Moore´s Law by allowing continued scaling through a reduction in footprint and operating voltage without compromising performance. This paper reviews recent advances in some of the key enabling process technology of InGaAs MOSFETs. It also outlines some of the challenges that need to be overcome before this new device family can become a reality.
  • Keywords
    CMOS integrated circuits; III-V semiconductors; MOSFET; gallium arsenide; indium compounds; nanoelectronics; InGaAs; Moore law; n-channel MOSFETs; nanoscale CMOS; nonsilicon n-channel material; process technology; HEMTs; Indium gallium arsenide; Indium phosphide; Logic gates; MODFETs; MOSFET;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting (IEDM), 2013 IEEE International
  • Conference_Location
    Washington, DC
  • Type

    conf

  • DOI
    10.1109/IEDM.2013.6724541
  • Filename
    6724541