Title :
Steganalysis Scheme Using the Difference Image of Calibrated Sub-sampling
Author :
Joo, Jeong-Chun ; Oh, Tae-Woo ; Choi, Jung-Ho ; Lee, Heung-Kyu
Author_Institution :
Dept. of Comput. Sci., Korea Adv. Inst. of Sci. & Technol., Daejeon, South Korea
Abstract :
This paper proposes a steganalysis scheme using the difference histogram and image calibration. The message embedding makes the correlation with the neighboring pixels weaken and the random changes of the pixel values generate the block effects among the pixels. The proposed method crops a suspicious image by 1 pixel in a row or column direction and compares the difference histograms. Two distance measures (Manhattan and Euclidean distance) are employed to evaluate the gap between the histograms. A support vector machine classifier is adopted to discriminate between natural and altered images. The experimental results verify that the proposed steganalysis can detect the altered images with high accuracy.
Keywords :
calibration; embedded systems; image classification; image coding; image sampling; message authentication; steganography; support vector machines; Euclidean distance; Manhattan distance; difference histogram; difference image; image calibration; image sampling; message embedding; steganalysis scheme; support vector machine classifier; Accuracy; Calibration; Correlation; Frequency modulation; Histograms; Pixel; Watermarking; Calibration; Difference histogram; Steganalysis; Steganography; Sub-sampling;
Conference_Titel :
Intelligent Information Hiding and Multimedia Signal Processing (IIH-MSP), 2010 Sixth International Conference on
Conference_Location :
Darmstadt
Print_ISBN :
978-1-4244-8378-5
Electronic_ISBN :
978-0-7695-4222-5
DOI :
10.1109/IIHMSP.2010.20