Length, scaling, and material dependence of crosstalk between distributed RC interconnects

Author

Davis, Jeff A. ; Meindl, James D.

Author_Institution

Microelectron. Res. Center, Georgia Inst. of Technol., Atlanta, GA, USA

fYear

1999

fDate

1999

Firstpage

227

Lastpage

229

Abstract

New general expressions for the transient response time and peak crosstalk of coupled distributed RC interconnects driven by a voltage source with finite rise-time and source impedance are presented. New compact expressions for peak crosstalk voltage reveal a previously unrecognized strong dependence of crosstalk on interconnect length, scaling, driver impedance, and materials properties for typical rise-time dominant interconnect circuits

Keywords

crosstalk; electric impedance; integrated circuit design; integrated circuit interconnections; integrated circuit metallisation; transient response; coupled distributed RC interconnects; crosstalk; distributed RC interconnects; driver impedance; finite rise-time; finite source impedance; interconnect length; interconnect material dependence; interconnect scaling; peak crosstalk; peak crosstalk voltage; rise-time dominant interconnect circuits; transient response time; voltage source; Coupling circuits; Crosstalk; Driver circuits; Genetic expression; Impedance; Integrated circuit interconnections; Material properties; Time factors; Transient response; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Interconnect Technology, 1999. IEEE International Conference

Conference_Location

San Francisco, CA

Print_ISBN

0-7803-5174-6

Type

conf

DOI

10.1109/IITC.1999.787129

Filename

787129