Title :
Analysis of spontaneous MEG activity in Alzheimer´s disease using time-frequency parameters
Author :
Poza, Jesús ; Hornero, Roberto ; Escudero, Javier ; Fernández, Alberto ; Gómez, Carlos
Author_Institution :
Biomedical Engineering Group (GIB), Dpt. TSCIT, University of Valladolid, Camino del Cementerio s/n, 47011, Spain
Abstract :
The aim of this study was to explore the ability of several time-frequency parameters to discriminate between spontaneous magnetoencephalographic (MEG) oscillations from 20 Alzheimer´s disease (AD) patients and 21 controls. The spectral crest factor (SCF) and the spectral turbulence (ST) were calculated from the time-frequency distribution of the normalized power spectral density averaged over all MEG sensors. Results revealed statistically significant higher SCF and ST mean values for AD patients than controls (p < 0.05). This fact suggests a significant decrease in irregularity of AD patients´ MEG activity. The standard deviation of SCF also provided significant differences (p < 0.05). This result indicates that AD patients showed a significantly higher variability than controls. The highest accuracy of 85.4% (90.5% sensitivity, 80.0% specificity) was achieved using simultaneously the mean value and the standard deviation of the SCF. We conclude that the variability of the spectral parameters can yield complementary information to the mean values, useful to help in AD detection.
Keywords :
Alzheimer´s disease; Character generation; Drugs; Electroencephalography; Magnetic analysis; Scalp; Signal analysis; Signal generators; Synchronous generators; Time frequency analysis; Adult; Algorithms; Alzheimer Disease; Biological Clocks; Brain; Diagnosis, Computer-Assisted; Female; Humans; Magnetoencephalography; Male; Reproducibility of Results; Sensitivity and Specificity; Signal Processing, Computer-Assisted;
Conference_Titel :
Engineering in Medicine and Biology Society, 2008. EMBS 2008. 30th Annual International Conference of the IEEE
Conference_Location :
Vancouver, BC
Print_ISBN :
978-1-4244-1814-5
Electronic_ISBN :
1557-170X
DOI :
10.1109/IEMBS.2008.4650511