Title :
InGaP/InGaAs dual-channel transistor
Author :
Chuang, Hung-Ming ; Uang, Chii-Maw ; Cheng, Shiou-Ying ; Chen, Chun-Yuan ; Lai, Po-Hsien ; Kao, Chung-I ; Tsai, Ym-Ying ; Hsu, Wei-Hsi ; Liu, Wen-Chau
Author_Institution :
Dept. of Electr. Eng., Cheng Kung Univ., Tainan, Taiwan
Abstract :
An interesting InGaP/InGaAs heterostructure field-effect transistor utilizing dual δ-doped quantum wells as double channels is studied and demonstrated. The employed dual δ-doped quantum wells and InGaP layer provide good carrier confinement and Schottky behavior, respectively. Good device performances including higher turn-on and breakdown voltages, high and linear transconductance and RF properties are obtained. For a 1 × 100 μm device, turn-on voltage of 1.74 V, maximum output current of 499 mA/mm, and maximum transconductance of 162 mS/mm with 303 mA/mm broad operation regime are obtained. The microwave properties of fT and fmax are 16 and 32.3 GHz, respectively. Furthermore, even the device is operated at higher temperature regime (>400K), insignificant degradations of DC and RF performances are observed.
Keywords :
III-V semiconductors; Schottky barriers; gallium arsenide; gallium compounds; heterojunction bipolar transistors; indium compounds; semiconductor device breakdown; semiconductor heterojunctions; semiconductor quantum wells; 1 micron; 1.74 V; 100 micron; 16 GHz; 162 mS/mm; 32.3 GHz; 400 K; InGaP/InGaAs dual-channel transistor; RF properties; Schottky behavior; breakdown voltages; carrier confinement; device performances; double channels; dual δ-doped quantum wells; heterostructure field-effect transistor; linear transconductance; turn-on voltages; Carrier confinement; Degradation; HEMTs; Indium gallium arsenide; MODFETs; Microwave devices; Radio frequency; Temperature; Transconductance; Voltage;
Conference_Titel :
Junction Technology, 2004. IWJT '04. The Fourth International Workshop on
Print_ISBN :
0-7803-8191-2
DOI :
10.1109/IWJT.2004.1306790