• DocumentCode
    3086753
  • Title

    Future scaling of Si based microelectronics and the role of consortia

  • Author

    Jammy, Raj

  • Author_Institution
    Materials and Emerging Technologies, Sematech, USA
  • fYear
    2011
  • fDate
    1-3 June 2011
  • Firstpage
    1
  • Lastpage
    1
  • Abstract
    Summary form only given. Semiconductor technology and its relentless scaling are at the core of many of the revolutionary gains humanity has witnessed in the last few decades. Future scaling options are promising, although complex and costly. Planar, Si-based materials integration for ever smaller devices has matured to heterointegration of non-Si materials today, and rapidly, scaling is moving to the 3rd dimension for devices and interconnects. Patterning technologies are pushing the limits of immersion-based deep UV technologies and are at the cusp of EUV technologies. Several options like nano imprint and directed self assembly are emerging to address cost and throughput issues.
  • Keywords
    integrated circuit manufacture; nanofabrication; nanolithography; nanopatterning; self-assembly; silicon; ultraviolet lithography; Consortia; EUV technologies; SEMATECH; Si; directed self assembly; immersion based deep UV technologies; nanoimprint; patterning technologies; scaling; semiconductor technology; silicon based materials; silicon based microelectronics;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Technologies Beyond 2020 (TTM), 2011 IEEE Technology Time Machine Symposium on
  • Conference_Location
    Hong Kong
  • Print_ISBN
    978-1-4577-0415-4
  • Electronic_ISBN
    978-1-4577-0416-1
  • Type

    conf

  • DOI
    10.1109/TTM.2011.6005167
  • Filename
    6005167