DocumentCode :
3087020
Title :
New twist to water cleaning guarantees reliability
Author :
Ameen, J.G.
Author_Institution :
IBM Corp., Endicott, NY, USA
fYear :
1992
fDate :
18-20 May 1992
Firstpage :
62
Lastpage :
65
Abstract :
The author previously showed how different types of testers can be used to monitor wet processes and determine the amount of ionic residues being left on a printed circuit. In the present work, it is shown how this type of technology can be upscaled so that substrates, cards, and boards can be cleaned to levels cleaner than that required of integrated circuits using mostly water. Cleaning circuits beyond the 18.3-MΩ resistivity endpoint of water is easily accomplished producing reliable circuits, which can easily pass insulation resistance testing. The units considered are characterized by relatively low cost, low pollution, and low water usage. These units are particularly desirable where pollution criteria and water usage are severely restricted
Keywords :
circuit reliability; insulation testing; printed circuit manufacture; surface treatment; cards; insulation resistance testing; ionic residues; pollution; printed circuit; reliability; resistivity endpoint; water cleaning; water usage; wet processes; Circuit testing; Cleaning; Conductivity; Costs; Insulation testing; Integrated circuit reliability; Integrated circuit technology; Monitoring; Printed circuits; Water pollution;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference, 1992. Proceedings., 42nd
Conference_Location :
San Diego, CA
Print_ISBN :
0-7803-0167-6
Type :
conf
DOI :
10.1109/ECTC.1992.204184
Filename :
204184
Link To Document :
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