Title :
Reduced conduction reserve of the propagating cardiac impulse in the diabetic rat heart: A model study
Author :
Ghaly, H. ; Boyle, P. ; Vigmond, E. ; Nygren, A.
Author_Institution :
Department of Electrical and Computer Engineering, University of Calgary, AB, Canada T2N 1N4
Abstract :
Conduction velocity is dependent on two main factors: intercellular electrical coupling and cellular electrical excitability. There is significant redundancy, ‘conduction reserve’, in these parameters such that significant reduction in the conduction velocity of the action potential requires either a severe change in one of these parameters or a combined change in both parameters. Studies in diabetic rat hearts have shown a significant reduction in the conduction reserve and it was hypothesized that this is mainly due to the lateralization of the gap junction protein connexin 43 (Cx43). To gain a better understanding of the effect of reduced intercellular coupling, a rat ventricle myocyte model was used to simulate propagation along a strand of cells. Simulations were performed to assess the effect of reduction of intercellular conductance on the conduction velocity. As the conductance of the gap junction decreased a significant reduction in the conduction velocity was observed. The relationship between conduction velocity and intercellular coupling became steeper with decreasing coupling, such that conduction velocity became increasingly sensitive to further uncoupling. This is consistent with experimental results, in which application of the gap junction uncoupler heptanol caused a larger conduction slowing in diabetic hearts than in controls.
Keywords :
Cardiac disease; Cardiovascular diseases; Computational modeling; Couplings; Diabetes; Heart; Mathematical model; Proteins; Rats; Sugar; Action Potentials; Animals; Computer Simulation; Diabetic Angiopathies; Heart Conduction System; Humans; Models, Cardiovascular; Neural Conduction; Rats;
Conference_Titel :
Engineering in Medicine and Biology Society, 2008. EMBS 2008. 30th Annual International Conference of the IEEE
Conference_Location :
Vancouver, BC
Print_ISBN :
978-1-4244-1814-5
Electronic_ISBN :
1557-170X
DOI :
10.1109/IEMBS.2008.4650564