• DocumentCode
    3087067
  • Title

    Correlation of thickness measurements obtained from cross-sectioning and from X-ray fluorescence spectrometry

  • Author

    Trabado, Flordeba L. ; Mendoza, J.S.

  • Author_Institution
    Intel Philippines Manuf. Inc., Makati Metro Manila, Philippines
  • fYear
    1992
  • fDate
    18-20 May 1992
  • Firstpage
    72
  • Lastpage
    76
  • Abstract
    Lead finish processes such as hot solder coat and solder plating differ in the deposit thickness distribution across the lead because of the surface thermodynamics of the system. Thickness measurements using the current methods of XRF (X-ray fluorescence) and cross-sectioning were evaluated. Results show that the thickness measurements using XRF correlate well with those obtained using cross-sectioning. However, cross-sectioning is more effective in solder dipped parts because of the nonuniform thickness distribution on the lead where the corner coverage is thinner than that at the center of the lead. XRF measurement of parts processed in solder coat can be influenced by obtaining measurements at the areas of the lead where the deposit is minimum and maximum
  • Keywords
    X-ray fluorescence analysis; electroplating; production testing; soldering; thickness measurement; X-ray fluorescence spectrometry; XRF; corner coverage; cross-sectioning; hot solder coat; solder dipped parts; solder plating; surface thermodynamics; thickness measurements; Area measurement; Coatings; Electrical resistance measurement; Fluorescence; Lead; Semiconductor materials; Spectroscopy; Thermodynamics; Thickness measurement; Tin;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 1992. Proceedings., 42nd
  • Conference_Location
    San Diego, CA
  • Print_ISBN
    0-7803-0167-6
  • Type

    conf

  • DOI
    10.1109/ECTC.1992.204186
  • Filename
    204186