DocumentCode :
3087130
Title :
Silver alloy wire for IC packaging solution
Author :
Tan Boo Wei ; Niu You Hua ; Wu Kang Sheng
Author_Institution :
R&D Dept., Carsem Semicond., Suzhou, China
fYear :
2015
fDate :
15-16 March 2015
Firstpage :
1
Lastpage :
3
Abstract :
In recent years, copper wire has been widely proliferated into mass production. However, the hardness of copper wire requires higher ultrasonic power and bonding force, which lead to higher risk of bond pad crack, in order to avoid bond pad crack without re-engineering the bond pad, silver alloy wire is proposed as an alternative to cu wire bonding due to its softer material property. In this paper, the authors researched into process development of silver alloy wire, including fine tuning of material properties, wire bond and assembly process optimization, and reliability assessment.
Keywords :
integrated circuit packaging; integrated circuit reliability; lead bonding; optimisation; silver alloys; Cu; Cu wire bonding; IC packaging solution; assembly process optimization; bonding force; copper wire hardness; fine tuning; material properties; reliability assessment; silver alloy wire; ultrasonic power; Lead; Optimization; Performance evaluation; Silver; Standards; Wires;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Semiconductor Technology International Conference (CSTIC), 2015 China
Conference_Location :
Shanghai
ISSN :
2158-2297
Type :
conf
DOI :
10.1109/CSTIC.2015.7153438
Filename :
7153438
Link To Document :
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