• DocumentCode
    3087213
  • Title

    Wavelet ANN based stator internal faults protection scheme for 3-phase induction motor

  • Author

    Devi, N. Rama ; Abdul Gafoor, Shaik ; Rao, P. V Ramana

  • Author_Institution
    Electr. & Electron. Eng., Bapatla Eng. Coll., Bapatla, India
  • fYear
    2010
  • fDate
    15-17 June 2010
  • Firstpage
    1457
  • Lastpage
    1461
  • Abstract
    This paper proposes a protection scheme based on Wavelet Multi Resolution Analysis and Artificial neural network which detects and classifies various possible stator winding fault of a three-phase induction motor such as inter turn faults, line to ground faults and line to line faults. The wavelet decomposition of three-phase stator currents is carried out with Bior5.5. The maximum value of absolute peak d1 coefficients of three-phase currents is defined as fault index which is compared with a predefined threshold to detect the fault. The normalized peak d1 coefficients of these currents are fed to a Feedforward neural network to classify various faults. The algorithm has been tested for various incidence angles and proved to be simple, reliable and effective in detecting and classifying the various stator winding faults.
  • Keywords
    electric machine analysis computing; fault diagnosis; feedforward neural nets; induction motor protection; stators; wavelet transforms; 3-phase induction motor; artificial neural network; feedforward neural network; stator internal faults protection; stator winding fault; three-phase induction motor; three-phase stator currents; wavelet ANN; wavelet multiresolution analysis; Artificial neural networks; Educational institutions; Fault detection; Induction motors; Multiresolution analysis; Protection; Stator windings; Testing; Wavelet analysis; Wavelet transforms; 3-phase induction motor; Artificial neural network; Multi Resolution Analysis; Stator internal faults;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Electronics and Applications (ICIEA), 2010 the 5th IEEE Conference on
  • Conference_Location
    Taichung
  • Print_ISBN
    978-1-4244-5045-9
  • Electronic_ISBN
    978-1-4244-5046-6
  • Type

    conf

  • DOI
    10.1109/ICIEA.2010.5514824
  • Filename
    5514824