Title :
Impact of Neutron-Induced Displacement Damage on the ATREE Response in LM124 Operational Amplifier
Author :
Roig, Fabien ; Dusseau, L. ; Ribeiro, P. ; Auriel, G. ; Roche, Nicholas J.-H ; Privat, A. ; Vaille, J.-R. ; Boch, J. ; Saigne, F. ; Marec, R. ; Calvel, P. ; Bezerra, F. ; Ecoffet, R. ; Azais, Bruno
Author_Institution :
Commissariat a l´Energie Atomique et aux Energies Alternatives, Gramat, France
Abstract :
The synergistic effect between displacement damage dose (DDD) and analog transient radiation effects on electronics (ATREE) in an operational amplifier (LM124) (opamp) from three different manufacturers is investigated. Pulsed X-ray experiments have highlighted ATREE sensitivity on devices significantly more important following exposure to fission neutrons than for unirradiated devices. A previously developed simulation tool is used to model ATREE responses taking into account the electrical parameters degradation due to displacement damage phenomenon. A good agreement is observed between model outputs and experimental ATREE results.
Keywords :
neutron effects; operational amplifiers; radiation hardening (electronics); ATREE response; DDD; LM124 operational amplifier; analog transient radiation effects on electronics; displacement damage dose; electrical parameter degradation; fission neutrons; neutron-induced displacement damage phenomenon; opamp; pulsed X-ray experiments; synergistic effect; unirradiated devices; Degradation; Electric variables measurement; Integrated circuit modeling; Operational amplifiers; Performance evaluation; Radiation effects; Single event transients; Transient response; Bipolar analog integrated circuits; X-ray effects; circuit modeling; displacement damage; total non-ionizing dose; transient radiation effects; transient response;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2014.2365048
