• DocumentCode
    3087668
  • Title

    The research of Risk assessment & Sampling methodology combination

  • Author

    Zhang, Nicholas ; Chou, Chad ; Guo, Sherry ; Ma, Jenny ; Kang, Randy

  • Author_Institution
    Quality & Reliability, Semicond. Manufactory Int. Corp., Tianjin, China
  • fYear
    2015
  • fDate
    15-16 March 2015
  • Firstpage
    1
  • Lastpage
    3
  • Abstract
    In ISO/TS16949 international standard, process audit is a mandatory system requirement, to confirm the effectiveness of the manufacturing process. But the standard doesn´t clearly indicate the specific sampling size. The sampling quantity is often judged by personal experience during the audit, which may lead to discrepancy when choosing the sampling size, which further leading to audit result difference. The outcomes of the research of the Risk assessment & Sampling methodology combination are to provide a kind of method, as a unified, the determination of specific audit sampling size of guide, to eliminate the differences between sampling by personal experience judgment, so as to ensure high consistency of audit results.
  • Keywords
    ISO standards; auditing; manufacturing processes; risk management; ISO-TS16949 international standard; audit sampling size; mandatory system requirement; manufacturing process; personal experience judgment; process audit; risk assessment; sampling methodology combination; Inspection; Lead; Manufacturing processes; Process control; Risk management; Standards organizations;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Technology International Conference (CSTIC), 2015 China
  • Conference_Location
    Shanghai
  • ISSN
    2158-2297
  • Type

    conf

  • DOI
    10.1109/CSTIC.2015.7153461
  • Filename
    7153461