• DocumentCode
    3087759
  • Title

    Optimization of Futurebus+backplane structures

  • Author

    Florescu, Viorica ; Lupien, R. Clifford

  • Author_Institution
    Digital Equipment of Canada Ltd., Kanata, Ont., Canada
  • fYear
    1992
  • fDate
    18-20 May 1992
  • Firstpage
    287
  • Lastpage
    292
  • Abstract
    Proper and reliable performance of a separable interconnect system based on a two-piece, contact-with-wipe type of connector is contingent on a complex set of factors including geometric and mechanical characteristics of the surrounding hardware. One important dependency is the stiffness of the backplane assembly. Excessive deflection can lead to inadequate connector mating and wipe with resultant opens or reliability problems. It can also result in excessive stress in the printed wire board structure. Backplane stiffness is considered as a function of three key parameters: printed wire board and 2-mm connector housing structure, loading forces generated in the module to backplane insertion process, and backplane edge support at the card cage attachment. The solution of this problem was ideally suited to finite element analysis. The model was validated by experimental deflection measurement. Agreement between the finite element analysis results and test data allowed optimization of the back plane stiffening structure at an early stage in the system design
  • Keywords
    electric connectors; finite element analysis; printed circuit accessories; reliability; system buses; backplane assembly; backplane edge support; card cage attachment; connector; connector housing structure; connector mating; contact-with-wipe type; deflection measurement; finite element analysis; loading forces; mechanical characteristics; printed wire board structure; reliability; separable interconnect system; stiffness; Assembly; Backplanes; Connectors; Contacts; Design optimization; Finite element methods; Hardware; Stress; System testing; Wire;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 1992. Proceedings., 42nd
  • Conference_Location
    San Diego, CA
  • Print_ISBN
    0-7803-0167-6
  • Type

    conf

  • DOI
    10.1109/ECTC.1992.204221
  • Filename
    204221