• DocumentCode
    3087825
  • Title

    Influence of pre-synthetic spinels on electrical properties of ZnO varistors

  • Author

    Qing, Zou ; Zhongyan, Meng

  • Author_Institution
    Dept. of Electron. Eng., Xi´´an Jiaotong Univ., China
  • fYear
    1992
  • fDate
    18-20 May 1992
  • Firstpage
    311
  • Lastpage
    315
  • Abstract
    A method of preparation of ZnO varistors, presynthetic spinels, was explored and its influence on electrical properties was examined. Microstructural features and distribution characteristics of the spinel phase in ZnO varistors were also investigated by electron probe microanalysis and TEM (transmission electron microscopy). The electrical properties of two types of samples are compared and discussed in relation to the spinel characteristics. The procedure of presynthetic spinels results in a drop of breakdown voltage of about 50%, a one-order decrease of leakage current, and a significant improvement of thermal stability. The I-V characteristics of ZnO varistors are influenced not only by the Bi2O3 intergranular phase, but also by the distribution characteristics of the spinel phases, which can be modified considerably by varying the technological procedure
  • Keywords
    II-VI semiconductors; ceramics; electric breakdown of solids; electron probe analysis; grain boundaries; grain growth; leakage currents; semiconductor technology; transmission electron microscope examination of materials; varistors; zinc compounds; Bi2O3 intergranular phase; I-V characteristics; TEM; ZnO varistors; breakdown voltage; distribution characteristics; electrical properties; electron probe microanalysis; leakage current; preparation; presynthetic spinels; semiconductors; spinel phase; thermal stability; transmission electron microscopy; Ball milling; Cooling; Diffraction; Electrons; Furnaces; Leakage current; Low voltage; Microstructure; Varistors; Zinc oxide;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 1992. Proceedings., 42nd
  • Conference_Location
    San Diego, CA
  • Print_ISBN
    0-7803-0167-6
  • Type

    conf

  • DOI
    10.1109/ECTC.1992.204225
  • Filename
    204225