DocumentCode :
3087939
Title :
The optimization of the high-temperature heat source for a MOCVD vacuum reactor
Author :
Hsien-Chih Chiu ; Chih-Kai Hu ; Hung-I Chien ; Li, Tomi T. ; Pi-Chen
Author_Institution :
Dept. of Mech. Eng., Nat. Central Univ., Taoyuan, Taiwan
fYear :
2015
fDate :
15-16 March 2015
Firstpage :
1
Lastpage :
3
Abstract :
Semiconductor equipment usually can be divided into five sub-system modules, (a) heating system, (b) exhausting system, (c) injecting system, (d) power control and (e) vacuum chamber. Metal organic chemical vapor deposition (MOCVD) process is the key process to deposit epitaxy thin film, and the uniformity is determined by the distribution of susceptor temperature. This research focuses on the development of high temperature heat source. The finite element software helps to develop the best results about the optimized geometry of the heater, the thickness of the susceptor, and the distance between the heater and susceptor. Furthermore, the optimum geometry of heater is received by numerical analysis combined with power controller. Compare with the experiment, the confidence level of software is 92%.
Keywords :
III-V semiconductors; MOCVD; exhaust systems; finite element analysis; gallium compounds; heating; power control; semiconductor thin films; wide band gap semiconductors; GaN; MOCVD vacuum reactor; epitaxy thin film; exhausting system; finite element software; heater optimized geometry; heating system; high-temperature heat source; injecting system; metal organic chemical vapor deposition; power control; semiconductor equipment; sub-system modules; susceptor temperature; susceptor thickness; vacuum chamber; Heating; Inductors; MOCVD;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Semiconductor Technology International Conference (CSTIC), 2015 China
Conference_Location :
Shanghai
ISSN :
2158-2297
Type :
conf
DOI :
10.1109/CSTIC.2015.7153475
Filename :
7153475
Link To Document :
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