DocumentCode :
3088203
Title :
Thin QFP design and development
Author :
Woosley, A. ; Djennas, F. ; McShane, M. ; Primeaux, F. ; Kraft, D. ; Reinhardt, R. ; Bigler, J. ; Casto, J.
Author_Institution :
Motorola Inc., Austin, TX, USA
fYear :
1992
fDate :
18-20 May 1992
Firstpage :
429
Lastpage :
437
Abstract :
The challenges presented by the low profile thin quad flat packages (TQFPs) are the design of the mold, control of the assembly operations of wire bonding and molding, moisture performance characteristics, and thermal and mechanical performance. The authors describe the design, modeling for manufacturability, and characterization of a TQFP. The design issues of the TQFP include package symmetry, die thickness, and wire bond loop height. Thermal, mechanical, and electrical modeling results are presented. The assembly process characterization and material selection are discussed. The package performance testing includes moisture weight gain studies, moist package cracking (popcorn) and delamination evaluation, temperature cycle, thermal shock, and autoclave. It is apparent from the moisture preconditioning data that care must be taken to keep the packages in a humidity-controlled environment. A preconditioning bake of 125°C for 8 h hours should be mandatory if packages are exposed to a high humidity environment for a long time period. However, it is clear that when preconditioned appropriately, the TQFP package should have a reliability performance comparable to that of a standard QFP package
Keywords :
environmental testing; integrated circuit technology; packaging; QFP design; assembly process characterization; autoclave; delamination evaluation; die thickness; humidity-controlled environment; low profile; material selection; modeling; moist package cracking; moisture performance characteristics; moisture weight gain studies; molding; package performance testing; package symmetry; popcorn; preconditioning bake; reliability performance; temperature cycle; thermal shock; thin quad flat packages; wire bond loop height; Assembly; Bonding; Delamination; Electronics packaging; Moisture control; Performance gain; Temperature; Testing; Virtual manufacturing; Wire;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference, 1992. Proceedings., 42nd
Conference_Location :
San Diego, CA
Print_ISBN :
0-7803-0167-6
Type :
conf
DOI :
10.1109/ECTC.1992.204243
Filename :
204243
Link To Document :
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