DocumentCode :
3088336
Title :
Percolation constraints in the use of conductor-filled polymers for interconnects
Author :
Ruschau, G.R. ; Yoshikawa, S. ; Newnham, R.E.
Author_Institution :
Mater Res. Lab., Pennsylvania State Univ., University Park, PA, USA
fYear :
1992
fDate :
18-20 May 1992
Firstpage :
481
Lastpage :
486
Abstract :
The properties of composite systems are understood in terms of percolation phenomena; when a sufficient amount of conductive filler is loaded into an insulating polymer matrix, the composite transforms from an insulator to a conductor, the result of continuous linkages of filler particles. The critical volume fraction at which this transformation occurs, Vc, is the focus of the investigation reported. The concentration is on the properties of some silver-filled silicon rubber composites, and it is shown how the artificial percolation restrictions affect both the critical volume fraction and the resistivity of the composite. A computer simulation of the two-dimensional case shows that these restrictions affect Vc in a predictable manner. An empirical method of predicting Vc for non-restricted systems is presented
Keywords :
conducting polymers; digital simulation; filled polymers; silver; Ag filled silicon rubber; computer simulation; conductive filler; conductor-filled polymers; continuous linkages of filler particles; critical volume fraction; filler concentration; interconnects; metal filled polymers; percolation phenomena; percolation restrictions; resistivity; two-dimensional case; Conducting materials; Electrodes; Filling; Geometry; Lattices; Plastic insulation; Polymers; Probability; Solid modeling; Transmission line matrix methods;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference, 1992. Proceedings., 42nd
Conference_Location :
San Diego, CA
Print_ISBN :
0-7803-0167-6
Type :
conf
DOI :
10.1109/ECTC.1992.204249
Filename :
204249
Link To Document :
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