DocumentCode
3088337
Title
Carbon nanotube complementary logic based on Erbium contacts and self-assembled high purity solution tubes
Author
Shu-Jen Han ; Oida, Soushi ; Hongsik Park ; Hannon, James B. ; Tulevski, George S. ; Haensch, Wilfried
Author_Institution
IBM T.J. Watson Res. Center, Yorktown Heights, NY, USA
fYear
2013
fDate
9-11 Dec. 2013
Abstract
Complementary logic gates based on chemically assisted directed assembly of solution carbon nanotubes with a high semiconducting purity (~91%) are demonstrated. Air stable, high quality carbon nanotube NFETs have been fabricated with low work function Erbium contacts, enabling an inverter gain of > 7 from transistors with 50 nm channel lengths. The substantial device yields of both NFET (~31%) and PFET (~44%) on the same chip allow us to construct and test a large number of CNT complementary logic gates for the first time. > 11% inverter yield from over 400 circuits tested along with fully functional NAND2 gates show promise of our fabrication scheme. This study points out several key directions for further yield enhancement, in which increasing the successful rate of CNT deposition into the trench plays a major role.
Keywords
carbon nanotube field effect transistors; erbium; logic gates; self-assembly; CNT deposition; Er; NAND2 gates; carbon nanotube NFET; carbon nanotube field effect transistors; channel lengths; chemically assisted directed assembly; complementary logic gates; erbium contacts; high purity solution tubes; high semiconducting purity; self assembly; size 50 nm; Aluminum oxide; Electron tubes; Erbium; Gold; Inverters; Logic gates; Passivation;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting (IEDM), 2013 IEEE International
Conference_Location
Washington, DC
Type
conf
DOI
10.1109/IEDM.2013.6724664
Filename
6724664
Link To Document