• DocumentCode
    3088470
  • Title

    Constitutive relations for tin-based-solder joints

  • Author

    Darveaux, Robert ; Banerji, Kingshuk

  • Author_Institution
    Motorola Inc., Ft. Lauderdale, FL, USA
  • fYear
    1992
  • fDate
    18-20 May 1992
  • Firstpage
    538
  • Lastpage
    551
  • Abstract
    The authors present extensive data on 62Sn36Pb2Ag, 60Sn40Pb, 96.5Sn3.5Ag, 97Pb3Sn, and 95Pb5Sn solders. All of the data were collected on actual soldered assemblies to properly account for the effects of grain size and intermetallic compound distribution. Tensile and shear loading were employed in the strain rate range between 10-7 and 10-1 s-1 and temperature range between 25 and 135°C. It is noted that all of the data can be fit to the same general form of constitutive relations, i.e. only the constants depend on the solder alloy. The derived constitutive relations are used to predict solder joint response under thermal cycling. Based on the calculated hysteresis loops, it is apparent that each solder will have a different acceleration factor between field use cycling and accelerated test cycling
  • Keywords
    lead alloys; life testing; materials testing; printed circuit manufacture; reliability; silver alloys; soldering; strain ageing; tensile testing; tin alloys; 25 to 135 C; Sn-Ag solder; Sn-Pb solder; Sn-Pb-Ag solder; accelerated test cycling; acceleration factor; constitutive relations; grain size; hysteresis loops; intermetallic compound distribution; shear loading; solder joint response; soldered assemblies; strain rate range; temperature range; thermal cycling; Assembly; Capacitive sensors; Creep; Grain size; Life estimation; Soldering; Steady-state; Stress; Temperature; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 1992. Proceedings., 42nd
  • Conference_Location
    San Diego, CA
  • Print_ISBN
    0-7803-0167-6
  • Type

    conf

  • DOI
    10.1109/ECTC.1992.204257
  • Filename
    204257