Title :
Quickest detection of changes in random fields
Author :
Hupkens, Erik P. ; Bagchi, Arunabha
Author_Institution :
Fac. of Appl. Math., Twente Univ., Enschede, Netherlands
fDate :
29 Jun-4 Jul 1997
Abstract :
The quickest detection problem is formulated for processes defined on a two-dimensional lattice. Solutions are given when only the class of sequential probability ratio tests is considered
Keywords :
approximation theory; lattice theory; random processes; signal processing; stochastic processes; quickest change detection problem; random fields; sequential probability ratio tests; two-dimensional lattice; Control systems; Cost function; Fault detection; Image processing; Lattices; Mathematics; Probability; Sequential analysis; Statistical analysis; Testing;
Conference_Titel :
Information Theory. 1997. Proceedings., 1997 IEEE International Symposium on
Conference_Location :
Ulm
Print_ISBN :
0-7803-3956-8
DOI :
10.1109/ISIT.1997.613468
