DocumentCode
3088703
Title
Sequential testing on the rate of a counting process
Author
Baras, J.S. ; Mac Enany, D.C.
Author_Institution
University of Maryland, College Park, MD
Volume
26
fYear
1987
fDate
9-11 Dec. 1987
Firstpage
1592
Lastpage
1593
Abstract
In this paper, optimality results are given for the problems of Bayesian and Wald sequential (simple, binary) hypothesis testing on the rate of a counting process. An explicit formula is given for the Bayes risk, and the system to solve for the exact optimal thresholds is also given.
Keywords
Bayesian methods; Costing; Costs; Educational institutions; Extraterrestrial measurements; Loss measurement; Probability; Sequential analysis; Sufficient conditions; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Decision and Control, 1987. 26th IEEE Conference on
Conference_Location
Los Angeles, California, USA
Type
conf
DOI
10.1109/CDC.1987.272710
Filename
4049561
Link To Document