• DocumentCode
    3089050
  • Title

    Repair of thin film wiring with laser-assisted processes

  • Author

    Wassick, T.A.

  • Author_Institution
    IBM E. Fishkill, Hopewell Junction, NY
  • fYear
    1992
  • fDate
    18-20 May 1992
  • Firstpage
    759
  • Lastpage
    762
  • Abstract
    The ability to repair defective circuit elements on the high end packaging components being built by IBM for the System/390 is important in meeting yield and reliability targets. A number of laser-based technologies have been developed at IBM, establishing the capability to modify fine line circuit patterns on a range of packaging materials. The ability to control the laser/material interaction with the ability to successfully modify the circuit without adversely affecting the integrity of the dielectric is discussed. Removal of unwanted conductors is done with a computer-controlled, excimer-laser micromachining system operating at 308 nm. New conductor segments are created through the laser chemical vapor deposition of gold from the pyrolytic decomposition of dimethyl-Au-trifluoroacetylacetonate. The applications of these techniques to IBM´s thin film packaging are described, with specific focus on the two technologies introduced for the manufacture of high end, thin film packaging products
  • Keywords
    chemical vapour deposition; laser beam machining; laser deposition; maintenance engineering; packaging; thin film circuits; 308 nm; Au; System/390; computer-controlled; defective circuit elements; excimer-laser micromachining; fine line circuit patterns; high end packaging components; laser chemical vapor deposition; laser-assisted processes; laser/material interaction; thin film wiring; wiring repair; Chemical lasers; Conducting materials; Dielectric materials; Dielectric thin films; Optical control; Optical materials; Packaging; Thin film circuits; Transistors; Wiring;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 1992. Proceedings., 42nd
  • Conference_Location
    San Diego, CA
  • Print_ISBN
    0-7803-0167-6
  • Type

    conf

  • DOI
    10.1109/ECTC.1992.204290
  • Filename
    204290