DocumentCode :
3089050
Title :
Repair of thin film wiring with laser-assisted processes
Author :
Wassick, T.A.
Author_Institution :
IBM E. Fishkill, Hopewell Junction, NY
fYear :
1992
fDate :
18-20 May 1992
Firstpage :
759
Lastpage :
762
Abstract :
The ability to repair defective circuit elements on the high end packaging components being built by IBM for the System/390 is important in meeting yield and reliability targets. A number of laser-based technologies have been developed at IBM, establishing the capability to modify fine line circuit patterns on a range of packaging materials. The ability to control the laser/material interaction with the ability to successfully modify the circuit without adversely affecting the integrity of the dielectric is discussed. Removal of unwanted conductors is done with a computer-controlled, excimer-laser micromachining system operating at 308 nm. New conductor segments are created through the laser chemical vapor deposition of gold from the pyrolytic decomposition of dimethyl-Au-trifluoroacetylacetonate. The applications of these techniques to IBM´s thin film packaging are described, with specific focus on the two technologies introduced for the manufacture of high end, thin film packaging products
Keywords :
chemical vapour deposition; laser beam machining; laser deposition; maintenance engineering; packaging; thin film circuits; 308 nm; Au; System/390; computer-controlled; defective circuit elements; excimer-laser micromachining; fine line circuit patterns; high end packaging components; laser chemical vapor deposition; laser-assisted processes; laser/material interaction; thin film wiring; wiring repair; Chemical lasers; Conducting materials; Dielectric materials; Dielectric thin films; Optical control; Optical materials; Packaging; Thin film circuits; Transistors; Wiring;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference, 1992. Proceedings., 42nd
Conference_Location :
San Diego, CA
Print_ISBN :
0-7803-0167-6
Type :
conf
DOI :
10.1109/ECTC.1992.204290
Filename :
204290
Link To Document :
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