Title :
Corner detection using the MAP technique
Author :
Zhang, Xining ; Haralick, Robert M. ; Ramesh, Visvanathan
Author_Institution :
Dept. of Electr. Eng., Washington Univ., Seattle, WA, USA
Abstract :
This paper describes a corner detection method that obtains maximum a posteriori estimates for the corner location in a given sequence of points. The authors model an ideal corner as the intersection of two ideal line segments. The perturbations on the sample points in a given line segment are assumed to be i.i.d Gaussian random variables of zero mean and variance σ2. Further, the perturbations on the points are assumed to be orthogonal to the ideal line. The paper discusses the theory of the corner detector and an algorithm that extends the basic theory to handle multilinear segment arcs. Experiments were conducted according to a specific protocol and performance curves showing the location error versus the noise variance, the included corner angle, and the arc length, are provided. Performance characterization of the corner detector is also performed by plotting the false alarm rate and the misdetect rate versus the context window length and included corner angle. It is shown that the experimental results match the theoretical error propagation
Keywords :
Bayes methods; MAP technique; context window length; corner detection; false alarm rate; i.i.d Gaussian random variables; ideal corner; location error; maximum a posteriori estimates; misdetect rate; noise variance; performance characterization; Algorithm design and analysis; Detectors; Equations; Estimation theory; Image segmentation; Linear approximation; Performance analysis; Protocols; Random variables; Zirconium;
Conference_Titel :
Pattern Recognition, 1994. Vol. 1 - Conference A: Computer Vision & Image Processing., Proceedings of the 12th IAPR International Conference on
Conference_Location :
Jerusalem
Print_ISBN :
0-8186-6265-4
DOI :
10.1109/ICPR.1994.576354