DocumentCode :
3089135
Title :
Guidelines for thermal management of multichip modules
Author :
Liang, Liang
Author_Institution :
VLSI Technology Inc., San Jose, CA
fYear :
1992
fDate :
18-20 May 1992
Firstpage :
787
Lastpage :
791
Abstract :
Thermal issues affecting MCM (multichip module) performance are addressed. The empirical data collected using a test chip, in accordance with SEMI-Standard measurement guidelines, are compared with the numerical values obtained using the finite element analysis software HYBRID THERMAL. Emphasis is placed in a low-cost MCM utilizing PCB (printed circuit board) and ceramic substrates where thermal management is most critical. Among the factors discussed are Si chip size, the distance of the chips from each other, heat spreading resistance throughout the package, substrate material, and thermal vias. The results obtained provide baseline guidelines which are valuable for small systems where low cost is key and thermal management options are limited. They are also useful for high-performance MCM applications, such as silicon-based substrates for high end application
Keywords :
circuit analysis computing; finite element analysis; multichip modules; substrates; temperature distribution; thermal analysis; HYBRID THERMAL; PCB substrates; SEMI-Standard measurement guidelines; Si; Si chip size; ceramic substrates; finite element analysis software; heat spreading resistance; multichip modules; thermal management; thermal vias; Circuit testing; Finite element methods; Guidelines; Multichip modules; Printed circuits; Semiconductor device measurement; Software measurement; Software testing; Thermal management; Thermal resistance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference, 1992. Proceedings., 42nd
Conference_Location :
San Diego, CA
Print_ISBN :
0-7803-0167-6
Type :
conf
DOI :
10.1109/ECTC.1992.204295
Filename :
204295
Link To Document :
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