Title :
Full Wave Solutions for Mueller Matrix Elements Used to Remotely Sense Irregular Stratified Structures
Author :
Bahar, Ezekiel ; Haugland, S. Mark ; Carrieri, Arthur H.
Author_Institution :
University of Nebraska-Lincoln
Keywords :
Backscatter; Coatings; Dielectric materials; Electromagnetic scattering; Military computing; Optical scattering; Optical surface waves; Rough surfaces; Surface roughness; Transmission line matrix methods;
Conference_Titel :
Geoscience and Remote Sensing Symposium, 1991. IGARSS '91. Remote Sensing: Global Monitoring for Earth Management., International
Print_ISBN :
0-87942-675-6
DOI :
10.1109/IGARSS.1991.579401