Title :
Design of high-speed metal-semiconductor-metal photodetectors: an optimization-based approach
Author_Institution :
Dept. of Electr. Eng., Stanford Univ., CA, USA
Abstract :
The finger sizing of interdigitated Schottky-barrier metal-semiconductor-metal photodetectors (MSM-PD) is discussed in this paper. We observe that a MSM-PD geometry with fast response speed can be determined by solving a special form of optimization problem called posynomial programming, for which very efficient global optimization methods have been developed. Our method, therefore, yields completely automated finger sizing of MSM-PD, directly from specifications.
Keywords :
Schottky barriers; metal-semiconductor-metal structures; photodetectors; automated finger sizing; global optimization methods; high-speed metal-semiconductor-metal photodetectors; interdigitated Schottky-barrier metal-semiconductor-metal photodetectors; Capacitance; Circuit testing; Delay; Design optimization; FETs; Fingers; Geometry; Optimization methods; Photodetectors; Time measurement;
Conference_Titel :
Electronic Design, Test and Applications, 2006. DELTA 2006. Third IEEE International Workshop on
Print_ISBN :
0-7695-2500-8
DOI :
10.1109/DELTA.2006.33
