Abstract :
The following topics are dealt with: analogue design; SoC and NoC testing; signal and image processing; advanced communication systems; high-performance reconfigurable computing; sensors, implants and display; advanced memory design; signal, faults and yield modeling; DSP and processor design; DfT and BIST; advanced testing techniques; advanced and high-level test methods.
Keywords :
built-in self test; design for testability; image processing; integrated circuit testing; memory architecture; prosthetics; sensors; signal processing; system-on-chip; BIST; DSP; DfT; NoC testing; SoC testing; advanced communication systems; advanced memory design; advanced testing techniques; analogue design; display; faults modeling; high-level test methods; high-performance reconfigurable computing; image processing; implants; processor design; sensors; signal modeling; signal processing; yield modeling;
Conference_Titel :
Electronic Design, Test and Applications, 2008. DELTA 2008. 4th IEEE International Symposium on
Conference_Location :
Hong Kong
Print_ISBN :
978-0-7695-3110-6
DOI :
10.1109/DELTA.2008.129
