Test pattern optimization using proper in mixed-mode technique

This paper presents a test pattern optimization approach using a proper number of seed selection in mixed-mode patterns. In mixed-mode patterns, the test set is assembled from LFSR based pseudorandom and deterministic patterns. The efficiency of this approach is largely determined by the ratio of those test patterns in the final test. The experiment results show that the total number of patterns in this optimized mixed-mode is minimized compared to conventional mixed-mode technique.