DocumentCode :
3089424
Title :
Novel implantation process of carbon nanotubes for plugs and vias, and their integration with transferred multilayer graphene wires
Author :
Sato, Mitsuhisa ; Takahashi, Masaharu ; Nihei, Mizuhisa ; Sato, Seiki ; Yokoyama, Naoki
Author_Institution :
Collaborative Res. Team Green Nanoelectron. Center (GNC), Nat. Inst. of Adv. Ind. Sci. & Technol. (AIST), Tsukuba, Japan
fYear :
2013
fDate :
9-11 Dec. 2013
Abstract :
We have developed a novel process, the implantation of carbon nanotubes (CNTs) into holes like plugs, vias, and through-silicon vias (TSVs) for the first time. The developed low-temperature process is suitable for back-end-of-line (BEOL) processes of LSI. With this approach, we can use high-quality CNTs grown at high temperature on a different substrate and densify CNTs. Consequently, the implanted CNT plugs had a resistance one order of magnitude lower than the directly grown CNT plugs. In addition, we successfully integrated the implanted CNT plug with transferred multilayer graphene (MLG) wires for all carbon interconnects.
Keywords :
carbon nanotubes; graphene; integrated circuit interconnections; ion implantation; large scale integration; low-temperature techniques; three-dimensional integrated circuits; vias; wires (electric); BEOL; C; CNT plugs; LSI; MLG wires; TSVs; back-end-of-line processes; carbon interconnects; carbon nanotubes; high-quality CNTs; holes; implantation process; low-temperature process; through-silicon vias; transferred multilayer graphene wires; Electrodes; Films; Gold; Plugs; Resistance; Substrates; Wires;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting (IEDM), 2013 IEEE International
Conference_Location :
Washington, DC
Type :
conf
DOI :
10.1109/IEDM.2013.6724716
Filename :
6724716
Link To Document :
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