Title :
Applications and design styles for 3DIC
Author :
Franzon, Paul D. ; Rotenberg, Eric ; Tuck, James ; Davis, William Rhett ; Huiyang Zhou ; Schabel, Joshua ; Zhang, Zhenhao ; Park, Jongho ; Dwiel, B. ; Forbes, Elliott ; Joonmoo Huh ; Priyadarshi, Shekhar ; Lipa, Steve ; Thorolfsson, Thor
Author_Institution :
Dept. of ECE, North Carolina State Univ., Raleigh, NC, USA
Abstract :
3D technologies offer significant potential to improve raw performance and performance per unit power. After exploiting TSV technologies for cost reduction and increasing memory bandwidth, the next frontier is to create more sophisticated solutions that promise further increases in power/performance beyond those attributable to memory interfaces alone. These include heterogeneous integration and exploitation of the high amounts of interconnect available to provide for customization. Challenges include the creation of physical standards and the design of sophisticated static and dynamic thermal management methods.
Keywords :
thermal management (packaging); three-dimensional integrated circuits; 3D technologies; 3DIC; TSV technologies; design styles; dynamic thermal management method; heterogeneous integration; memory bandwidth; memory interfaces; static thermal management method; Bandwidth; Integrated circuit interconnections; Random access memory; Silicon; Standards; Three-dimensional displays; Through-silicon vias;
Conference_Titel :
Electron Devices Meeting (IEDM), 2013 IEEE International
Conference_Location :
Washington, DC
DOI :
10.1109/IEDM.2013.6724717